[PS-3-2] Influence of Structural Parameters on Performance of Schottky Tunneling FET Electrical Characteristics and its Scalability

Y. Wu^1,2,3, C. Dou^1,2,3, K. Kakushima², K. Ohmori⁴, P. Ahmet¹, T. Watanabe⁵, K. Tsutsui², A. Nishiyama², N. Sugii², K. Natori¹, K. Yamada⁴, Y. Kataoka², T. Hattori¹, H. Iwai¹ (1.Tokyo Tech., 2.Tokyo Tech., 3.Univ. of Tsukuba, 4.Univ. of Tsukuba, 5.Waseda Univ. , Japan)

https://doi.org/10.7567/SSDM.2012.PS-3-2