[PS-3-2] Influence of Structural Parameters on Performance of Schottky Tunneling FET Electrical Characteristics and its Scalability

Y. Wu^1,2,3、C. Dou^1,2,3、K. Kakushima²、K. Ohmori⁴、P. Ahmet¹、T. Watanabe⁵、K. Tsutsui²、A. Nishiyama²、N. Sugii²、K. Natori¹、K. Yamada⁴、Y. Kataoka²、T. Hattori¹、H. Iwai¹ (1.Tokyo Tech.、2.Tokyo Tech.、3.Univ. of Tsukuba、4.Univ. of Tsukuba、5.Waseda Univ. , Japan)

https://doi.org/10.7567/SSDM.2012.PS-3-2