[PS-3-26] 1/f Noise Characteristic in Independent-Double-Gate-FinFET

H. Sakai¹, S. Ouchi², K. Endo², T. Matsukawa², Y. X. Liu², Y. Ishikawa², T. Tsukada², T. Nakagawa², T. Sekigawa², H. Koike², M. Masahara², H. Ishikuro¹ (1.Keio Univ., 2.National Inst. of Advanced Indus. Sci. and Tech. (AIST) , Japan)

https://doi.org/10.7567/SSDM.2012.PS-3-26