The Japan Society of Applied Physics

[PS-3-26] 1/f Noise Characteristic in Independent-Double-Gate-FinFET

H. Sakai1、S. Ouchi2、K. Endo2、T. Matsukawa2、Y. X. Liu2、Y. Ishikawa2、T. Tsukada2、T. Nakagawa2、T. Sekigawa2、H. Koike2、M. Masahara2、H. Ishikuro1 (1.Keio Univ.、2.National Inst. of Advanced Indus. Sci. and Tech. (AIST) , Japan)

https://doi.org/10.7567/SSDM.2012.PS-3-26