The Japan Society of Applied Physics

[PS-3-26] 1/f Noise Characteristic in Independent-Double-Gate-FinFET

H. Sakai1, S. Ouchi2, K. Endo2, T. Matsukawa2, Y. X. Liu2, Y. Ishikawa2, T. Tsukada2, T. Nakagawa2, T. Sekigawa2, H. Koike2, M. Masahara2, H. Ishikuro1 (1.Keio Univ., 2.National Inst. of Advanced Indus. Sci. and Tech. (AIST) , Japan)

https://doi.org/10.7567/SSDM.2012.PS-3-26