1/f Noise Characteristic in Independent-Double-Gate-FinFET

H. Sakai; S. Ouchi; K. Endo; T. Matsukawa; Y. X. Liu; Y. Ishikawa; T. Tsukada; T. Nakagawa; T. Sekigawa; H. Koike; M. Masahara; H. Ishikuro

doi:https://doi.org/10.7567/SSDM.2012.PS-3-26

2012 International Conference on Solid State Devices and Materials

2012年9月25日〜 2012年9月27日
Kyoto International Conference Center, Kyoto, Japan

[PS-3-26] 1/f Noise Characteristic in Independent-Double-Gate-FinFET

H. Sakai¹、S. Ouchi²、K. Endo²、T. Matsukawa²、Y. X. Liu²、Y. Ishikawa²、T. Tsukada²、T. Nakagawa²、T. Sekigawa²、H. Koike²、M. Masahara²、H. Ishikuro¹ (1.Keio Univ.、2.National Inst. of Advanced Indus. Sci. and Tech. (AIST) , Japan)

https://doi.org/10.7567/SSDM.2012.PS-3-26

▲