[PS-3-27] Narrow Width Effects on High Frequency Performance and RF Noise of Sub-40nm Multi-finger nMOSFETs

K. L. Yeh¹、C. S. Chang¹、J. C. Guo¹ (1.National Chiao-Tung Univ. , Taiwan)

https://doi.org/10.7567/SSDM.2012.PS-3-27