[PS-6-18] Interface analysis of AlN/InAs(001) and AlN/Ge/InAs(001) by angle-resolved X-ray photoelectron spectroscopy

M. Kudo¹、H. A. Shih¹、T. Suzuki¹ (1.JAIST , JAPAN)

https://doi.org/10.7567/SSDM.2012.PS-6-18