[PS-6-8] Temperature Effect on Electrical Properties of HfInZnO Amorphous Oxide Thin Film Transistor

J. S. Chang¹、J. H. Kim¹、D. W. Kwon¹、B. G. Park¹ (1.Natl. Univ. of Seoul , Republic of Korea)

https://doi.org/10.7567/SSDM.2012.PS-6-8