[PS-9-6] Resistance Switching Memory Characteristics of Si/CaF₂/CdF₂ Quantum-well Structures Grown on Metal(CoSi₂) Layer

J. Denda¹, K. Uryu¹, M. Watanabe¹ (1.Tokyo Tech. , Japan)

https://doi.org/10.7567/SSDM.2012.PS-9-6