The Japan Society of Applied Physics

[A-7-4] Excellent Reliability and Switching Uniformity of RRAM by Optimizing SET/RESET Pulse Shape to Minimize Current Overshoot

J.H. Song1、D.S. Lee1、J.Y. Woo1、Y.M. Koo1、E.J. Cha1、S.H. Lee1、J.S. Park1、K.B. Moon1、H.S. Hwang1 (1.Pohang Univ. of Sci. and Tech. (Korea))

https://doi.org/10.7567/SSDM.2013.A-7-4