[A-7-4] Excellent Reliability and Switching Uniformity of RRAM by Optimizing SET/RESET Pulse Shape to Minimize Current Overshoot

J.H. Song¹、D.S. Lee¹、J.Y. Woo¹、Y.M. Koo¹、E.J. Cha¹、S.H. Lee¹、J.S. Park¹、K.B. Moon¹、H.S. Hwang¹ (1.Pohang Univ. of Sci. and Tech. (Korea))

https://doi.org/10.7567/SSDM.2013.A-7-4