[A-7-4] Excellent Reliability and Switching Uniformity of RRAM by Optimizing SET/RESET Pulse Shape to Minimize Current Overshoot

J.H. Song¹, D.S. Lee¹, J.Y. Woo¹, Y.M. Koo¹, E.J. Cha¹, S.H. Lee¹, J.S. Park¹, K.B. Moon¹, H.S. Hwang¹ (1.Pohang Univ. of Sci. and Tech. (Korea))

https://doi.org/10.7567/SSDM.2013.A-7-4