The Japan Society of Applied Physics

[D-3-2] Channel Length Scaling Limits of III-V Channel MOSFETs Governed by Source-Drain Direct Tunneling

S. Koba1, M. Ohmori1, Y. Maegawa1, H. Tsuchiya1,2, Y. Kamakura2,3, N. Mori2,3, M. Ogawa1 (1.Kobe Univ., 2.JST-CREST, 3.Osaka Univ. (Japan))

https://doi.org/10.7567/SSDM.2013.D-3-2