The Japan Society of Applied Physics

[D-3-2] Channel Length Scaling Limits of III-V Channel MOSFETs Governed by Source-Drain Direct Tunneling

S. Koba1、M. Ohmori1、Y. Maegawa1、H. Tsuchiya1,2、Y. Kamakura2,3、N. Mori2,3、M. Ogawa1 (1.Kobe Univ.、2.JST-CREST、3.Osaka Univ. (Japan))

https://doi.org/10.7567/SSDM.2013.D-3-2