[J-5-4] Neutron Induced Single-Event Burnout in SiC Power Diode

T. Shoji^1,3, S. Nishida², K. Hamada², H. Tadano³ (1.Toyota Central R&D Labs., Inc., 2.Toyota Motor Corp., 3.Univ. of Tsukuba (Japan))

https://doi.org/10.7567/SSDM.2013.J-5-4