[J-5-4] Neutron Induced Single-Event Burnout in SiC Power Diode

T. Shoji^1,3、S. Nishida²、K. Hamada²、H. Tadano³ (1.Toyota Central R&D Labs., Inc.、2.Toyota Motor Corp.、3.Univ. of Tsukuba (Japan))

https://doi.org/10.7567/SSDM.2013.J-5-4