[PS-15-2] Influence of Post-Deposition Annealing on the Passivation Quality of Room Temperature Atomic Layer Deposited Aluminum Oxide
H. Lee1,4、T. Nagata3、N. Ikeno1、K. Arafune2,4、H. Yoshida2,4、S. Satoh2,4、T. Chikyow3、A. Ogura1,4
(1.Meiji Univ.、2.Univ. of Hyogo、3.National Inst. of Materials Sci.、4.JST-CREST (Japan))
https://doi.org/10.7567/SSDM.2013.PS-15-2