[PS-3-11] Understanding HCI Variability in Deeply Scaled nMOSFETs

L.J. Ma¹、X.L. Ji¹、Z.X. Chen²、Y.M. Liao¹、F. Yan¹、Y.L. Song³、Q. Guo⁴ (1.Nanjing Univ.、2.SanDisk Info. Tech. Co. Ltd.、3.SMIC、4.WXSMC (China))

https://doi.org/10.7567/SSDM.2013.PS-3-11