Understanding HCI Variability in Deeply Scaled nMOSFETs

2013 International Conference on Solid State Devices and Materials

Sep 24, 2013 - Sep 27, 2013
Hilton Fukuoka Sea Hawk, Fukuoka, Japan

L.J. Ma¹, X.L. Ji¹, Z.X. Chen², Y.M. Liao¹, F. Yan¹, Y.L. Song³, Q. Guo⁴ (1.Nanjing Univ., 2.SanDisk Info. Tech. Co. Ltd., 3.SMIC, 4.WXSMC (China))