[PS-3-12] Effect of dynamic stress on OFF leakage of nanoscale pMOSFETs at high temperature

G.J. Kim¹、J.H. Seo¹、D. Son¹、S. Lee¹、C Kim¹、B. Kang¹ (1.Pohang Univ. of Sci. and Tech. (Korea))

https://doi.org/10.7567/SSDM.2013.PS-3-12