[PS-3-12] Effect of dynamic stress on OFF leakage of nanoscale pMOSFETs at high temperature

G.J. Kim¹, J.H. Seo¹, D. Son¹, S. Lee¹, C Kim¹, B. Kang¹ (1.Pohang Univ. of Sci. and Tech. (Korea))

https://doi.org/10.7567/SSDM.2013.PS-3-12