The Japan Society of Applied Physics

[PS-3-13] Trap-Assisted Tunneling on Extended Defects in Tunnel Field-Effect Transistors

M. Reiche1, M. Kittler2, H. Uebensee3 (1.Max Planck Inst. of Microstructure Physics, 2.IHP microelectronics, 3.CIS Res. Inst. of Microsensorics and Photovoltaics (Germany))

https://doi.org/10.7567/SSDM.2013.PS-3-13