Trap-Assisted Tunneling on Extended Defects in Tunnel Field-Effect Transistors

M. Reiche; M. Kittler; H. Uebensee

doi:https://doi.org/10.7567/SSDM.2013.PS-3-13

2013 International Conference on Solid State Devices and Materials

Sep 24, 2013 - Sep 27, 2013
Hilton Fukuoka Sea Hawk, Fukuoka, Japan

[PS-3-13] Trap-Assisted Tunneling on Extended Defects in Tunnel Field-Effect Transistors

M. Reiche¹, M. Kittler², H. Uebensee³ (1.Max Planck Inst. of Microstructure Physics, 2.IHP microelectronics, 3.CIS Res. Inst. of Microsensorics and Photovoltaics (Germany))

https://doi.org/10.7567/SSDM.2013.PS-3-13

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