Trap-Assisted Tunneling on Extended Defects in Tunnel Field-Effect Transistors

M. Reiche; M. Kittler; H. Uebensee

doi:https://doi.org/10.7567/SSDM.2013.PS-3-13

2013 International Conference on Solid State Devices and Materials

2013年9月24日〜 2013年9月27日
Hilton Fukuoka Sea Hawk, Fukuoka, Japan

[PS-3-13] Trap-Assisted Tunneling on Extended Defects in Tunnel Field-Effect Transistors

M. Reiche¹、M. Kittler²、H. Uebensee³ (1.Max Planck Inst. of Microstructure Physics、2.IHP microelectronics、3.CIS Res. Inst. of Microsensorics and Photovoltaics (Germany))

https://doi.org/10.7567/SSDM.2013.PS-3-13

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