The Japan Society of Applied Physics

[PS-4-6L] Extraction of Trapped Charge Profile in Space and Energy in P-Channel SONOS Memory Device

Y.Y. Chiu1、B.J. Yang1、F.H. Li1、R.W. Chang1、S.F. Ng1、W.T. Sun2、C.J. Hsu2、C.W. Kuo2、C.Y. Lo2、R. Shirota1 (1.National Chiao Tung Univ.、2.eMemory Tech. Inc. (Taiwan))

https://doi.org/10.7567/SSDM.2013.PS-4-6L