[PS-6-23] Improved Stability of ZnO Thin Film Transistor with Dual Gate Structure under Negative Bias Stress

H.J. Yun¹, Y.S. Kim², Y.M. Kim¹, S.D. Yang¹, H.D. Lee¹, G.W. Lee¹ (1.National Univ. of Chungnam, 2.National Nanofab Center (Korea))

https://doi.org/10.7567/SSDM.2013.PS-6-23