[J-2-1] Comprehensive Investigation of Self-Heating Effect (SHE) in Nanoscale Planar and Fin FETs: Impacts of Device Parameters on SHE and Analog Performance Optimization

T. Takahashi^1,2, T. Matsuki³, T. Shinada³, Y. Inoue³, K. Uchida^1,2 (1.Keio Univ., 2.JST-CREST, 3.AIST (Japan))

https://doi.org/10.7567/SSDM.2014.J-2-1