[J-2-1] Comprehensive Investigation of Self-Heating Effect (SHE) in Nanoscale Planar and Fin FETs: Impacts of Device Parameters on SHE and Analog Performance Optimization

T. Takahashi^1,2、T. Matsuki³、T. Shinada³、Y. Inoue³、K. Uchida^1,2 (1.Keio Univ.、2.JST-CREST、3.AIST (Japan))

https://doi.org/10.7567/SSDM.2014.J-2-1