On the Importance of Electron-electron Scattering for Hot-carrier Degradation

S. Tyaginov; M. Bina; J. Franco; B. Kaczer; T. Grasser

doi:https://doi.org/10.7567/SSDM.2014.J-4-3

2014 International Conference on Solid State Devices and Materials

Sep 8, 2014 - Sep 11, 2014
Tsukuba International Congress Center (EPOCHAL TSUKUBA), Ibaraki, Japan

[J-4-3] On the Importance of Electron-electron Scattering for Hot-carrier Degradation

S. Tyaginov^1,2, M. Bina¹, J. Franco³, B. Kaczer³, T. Grasser³ (1.Inst. for Microelectronics, TU Wien, 2.Ioffe Physical-Technical Inst., 3.imec (Austria))

https://doi.org/10.7567/SSDM.2014.J-4-3

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