[J-4-3] On the Importance of Electron-electron Scattering for Hot-carrier Degradation

S. Tyaginov^1,2、M. Bina¹、J. Franco³、B. Kaczer³、T. Grasser³ (1.Inst. for Microelectronics, TU Wien、2.Ioffe Physical-Technical Inst.、3.imec (Austria))

https://doi.org/10.7567/SSDM.2014.J-4-3