[PS-1-8] Assessment of Self Heating Effect (SHE) on Negative Bias Temperature Instability in SOI FinFETs under Circuit Operation

H. Jiang¹, Z.Y. Lun¹, B. Chen¹, G. Du¹, X.Y. Liu¹, X. Zhang¹ (1.Peking Univ. (China))

https://doi.org/10.7567/SSDM.2014.PS-1-8