[PS-1-8] Assessment of Self Heating Effect (SHE) on Negative Bias Temperature Instability in SOI FinFETs under Circuit Operation

H. Jiang¹、Z.Y. Lun¹、B. Chen¹、G. Du¹、X.Y. Liu¹、X. Zhang¹ (1.Peking Univ. (China))

https://doi.org/10.7567/SSDM.2014.PS-1-8