[PS-6-17L] Physical Mechanism of Source and Drain Resistance Reduction in Oxide TFT ~Towards High-Performance Short-Channel InGaZnO TFT~
K. Ota1, K. Sakuma1, T. Irisawa1, C. Tanaka1, D. Matsushita1, M. Saitoh1
(1.Toshiba Corp. (Japan))
https://doi.org/10.7567/SSDM.2014.PS-6-17L