11:15 〜 11:30

[C-7-3] Temperature-Dependent Minority Carrier Lifetime of Crystalline Silicon Wafers Passivated by High Quality Amorphous Silicon Oxide

^○M. Inaba¹, S. Todoroki¹, K. Nakada¹, S. Miyajima¹ (1.Tokyo Tech(Japan))

https://doi.org/10.7567/SSDM.2015.C-7-3