17:25 〜 17:45

[K-5-1] Transistor-level Characterization of SRAM Bit Failures Induced by Random Telegraph Noise

^○T. Mizutani¹, T. Saraya¹, K. Takeuchi¹, M. Kobayashi¹, T. Hiramoto¹ (1.Univ. of Tokyo(Japan))

https://doi.org/10.7567/SSDM.2015.K-5-1