The Japan Society of Applied Physics

10:45 〜 11:05

[K-7-1] Reliability of Improved CAAC-IGZO FET Satisfying NOSRAM Performance

T. Murakawa1, K. Ohshima1, M. Tsubuku1, D. Shimada1, N. Kamata1, T. Tanaka1, A. Shimomura1, M. Sakakura1, Y. Yamamoto1, S. Yamazaki1 (1.Semiconductor Energy Lab. Co. Ltd.(Japan))

https://doi.org/10.7567/SSDM.2015.K-7-1