The Japan Society of Applied Physics

2:00 PM - 2:30 PM

[O-1-1] (Invited) Conductive Bridge RAM (CBRAM): functionality, reliability and applications

G. Molas, J. Guy, M. Barci, F. Longnos, G. Palma, E. Vianello, P. Blaise, B. De Salvo, L. Perniola (1.CEA-LETI(France))

https://doi.org/10.7567/SSDM.2015.O-1-1