[PS-14-13] Special Features in Stress Degradation of SiC-MOSFETs Observed in I-V Characteristics

^○E. Murakami¹, K. Oda¹, T. Takeshita¹ (1.Kyushu Sangyo Univ.(Japan))

https://doi.org/10.7567/SSDM.2015.PS-14-13