[PS-14-19L] Investigation of Deep Levels in Diamond Based Radiation Detector by Transient Charge Spectroscopy with Focused Heavy Ion Microbeam

^○Y. Ando^{1, 2}, Y. Kambayashi^{1, 2}, W. Kada¹, S. Onoda², T. Makino², S. Sato², H. Umezawa³, Y. Mokuno³, S. Shikata⁴, O. Hanaizumi¹, T. Kamiya², T. Ohshima² (1.Gunma Univ., 2.JAEA, 3.AIST, 4.Kwansei Gakuin Univ.(Japan))

https://doi.org/10.7567/SSDM.2015.PS-14-19L