The Japan Society of Applied Physics

[PS-3-13] The Limits of Applicability of the Analytic Model for Hot Carrier Degradation

M. Jech1, P. Sharma1, S. Tyaginov1,2, F. Rudolf1, T. Grasser1 (1.Tech. Univ. of Vienna, 2.Ioffe Physical-Techn. Inst.(Austria))

https://doi.org/10.7567/SSDM.2015.PS-3-13