[PS-3-13] The Limits of Applicability of the Analytic Model for Hot Carrier Degradation

^○M. Jech¹, P. Sharma¹, S. Tyaginov^1,2, F. Rudolf¹, T. Grasser¹ (1.Tech. Univ. of Vienna, 2.Ioffe Physical-Techn. Inst.(Austria))

https://doi.org/10.7567/SSDM.2015.PS-3-13