2015 International Conference on Solid State Devices and Materials
Sep 27, 2015 - Sep 30, 2015 Sapporo Convention Center, Sapporo, Japan
[PS-9-12] Changes in Morphology and Local Conductance of GeTe-Sb2Te3 Superlattice Films on Silicon Made by Scanning Probe Microscopy in a Lithography Mode
○L. Bolotov1,2, T. Tada1,2, Y. Saito1,2, J. Tominaga1,2 (1.AIST, 2.JST-CREST(Japan))
