14:00 〜 14:20

[A-4-02] Reliability Analysis for Monolithic 3D UTB GeOI and SOI 6T SRAM Cells considering Interlayer Coupling

^○V. P. -H. Hu¹ (1.National Central Univ.(Taiwan))

https://doi.org/10.7567/SSDM.2016.A-4-02