14:20 〜 14:40

[A-4-03] A New NBTI Lifetime Prediction Method for Deeply Scaled pMOSFETs

C. Zhang¹, Y. Liao¹, Y. Xu²,^○X. Ji¹ (1.Nanjing Univ.(China), 2.Nanjing Univ. of Posts and Telecommunications(China))

https://doi.org/10.7567/SSDM.2016.A-4-03