The Japan Society of Applied Physics

11:15 〜 11:45

[A-6-01(Invited)] Bias Temperature Instability in Tunnel FETs

W. Mizubayashi1, T. Mori1, K. Fukuda1, Y. Ishikawa1, Y. Morita1, S. Migita1, H. Ota1, Y. X. Liu1, S. O'uchi1, J. Tsukada1, H. Yamauchi1, T. Matsukawa1, M. Masahara1, K. Endo1 (1.AIST(Japan))

https://doi.org/10.7567/SSDM.2016.A-6-01