14:20 〜 14:40

[A-7-02] Drain-Bias Dependency on Statistical Variability for Tunnel Field-Effect Transistors

^○W. Y. Choi¹, S. H. Choi¹, J. W. Lee¹, I. Huh¹ (1.Sogang Univ.(Korea))

https://doi.org/10.7567/SSDM.2016.A-7-02