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[PS-3-11] Low Frequency Noise of Accumulation-Mode n- and p-MOSFETs fabricated on (110) Crystallographic Silicon-Oriented Wafers

^○P. Gaubert¹, A. Teramoto¹, S. Sugawa¹ (1.Tohoku Univ.(Japan))

https://doi.org/10.7567/SSDM.2016.PS-3-11