Reliability of Epitaxial Nickel Disilicide Thin Film

2016 International Conference on Solid State Devices and Materials

Sep 26, 2016 - Sep 29, 2016
Tsukuba International Congress Center, Tsukuba, Japan

11:09 AM - 11:12 AM

^○C. Hsin¹, S. Lee¹ (1.National Central Univ.(Taiwan))