14:00 〜 14:15 [C-1-02] Carrier Transport across ITO/MoOx/SiOx/Si Interfaces ○T. Kamioka1, Y. Hayashi1, Y. Isogai1, K. Nakamura2, Y. Ohshita1 (1.Toyota Technol. Inst. (Japan), 2.Meiji Univ. (Japan)) https://doi.org/10.7567/SSDM.2017.C-1-02